Micromachines · 2026-09-08
This review connects vertical heat buildup in denser HBM stacks with warpage, delamination, copper protrusion, voids, electromigration, and joint degradation. It surveys thermal-interface materials, underfill, molding compounds, heat spreaders, and high-conductivity composites as a coupled design space rather than isolated fixes. The paper is a useful failure-mode map for HBM packaging, but it synthesizes prior work instead of reporting new silicon.
这篇综述把更高层数HBM中的垂直积热,与翘曲、分层、铜凸起、空洞、电迁移和焊点退化联系起来。论文系统梳理热界面材料、底部填充、塑封料、均热结构和高导热复合材料,强调它们构成相互耦合的设计空间,而非彼此孤立的补救手段。它为HBM封装提供了有用的失效模式地图,但属于既有工作的综合,并未报告新硅片结果。
M. Wei, Anton Sattler, H. Amrouch
IEEE Transactions on Circuits and Systems Part 1: Regular Papers · 2026-09-01
A physics-guided neural model predicts thermal maps for 2.5D chiplet systems and feeds them into signal-integrity analysis, avoiding repeated full multiphysics simulation. Its cross feature captures heat-flux exchange between chiplets, while a new equivalent model supports pillar-style microbumps when generating training data. The approach targets faster design-space exploration, but its transferability beyond the evaluated package configurations remains the key practical question.
该工作用物理引导神经网络预测2.5D chiplet系统热图,并把结果用于信号完整性分析,以避免反复运行完整多物理场仿真。其交叉特征用于捕捉chiplet之间的热流交换,新等效模型则在生成训练数据时支持柱状微凸点。该方法面向更快的设计空间探索,但能否迁移到论文评估范围之外的封装配置,仍是主要工程问题。