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Research digest · Saturday, July 4, 2026 研究摘要 · 2026年7月4日 星期六

Memory-Centric Compute Moves Closer to Silicon 以存储为中心的计算走近硅片

This week's research queue emphasizes measured devices, memory-adjacent compute, and security checks at the library level. The common thread is moving useful work closer to sensors, memories, and specialized fabrics while keeping an eye on retention, thermal paths, and implementation risk. 本周研究阅读队列突出已测器件、靠近存储的计算,以及标准单元库层面的安全检查。共同主线是在传感器、存储和专用计算织构附近完成更多有用工作,同时关注保持特性、热路径和实现风险。

Look-back window: 7 days · 9 paper(s) 回溯窗口: 7天 · 9篇

Devices & Process 器件与工艺

Triple-Hysteresis Antiferroelectric Thin Films for Giant Negative Electrocaloric Effect 用于巨大负电热效应的三重滞回反铁电薄膜

P. Su, J. Chen, J. Li, et al.

Science Advances · 2026-07-03

Su et al. stabilize a ferrielectric phase inside low-temperature PbZrO3 thin films, creating a triple-hysteresis loop rather than the usual ferroelectric or antiferroelectric response. The reported electrocaloric temperature change reaches -23.76 K by Maxwell-relation extraction, about a 600% enhancement versus the double-hysteresis baseline in the abstract. The result is interesting for solid-state cooling and multistate memory, but the cooling number is still an inferred device metric rather than a packaged thermal system. Su等人在低温制备的PbZrO3薄膜中稳定出铁电相,在常见铁电或反铁电响应之外形成三重滞回回线。摘要给出的基于Maxwell关系提取的电热温变达到-23.76 K,较双重滞回基线提升约600%。该结果对固态制冷和多态存储有吸引力,但这个制冷指标仍是器件层面推导值,而不是封装热系统实测。

Al2O3 Barrier Engineering Improves HfO2-Based Si-Channel FeFET Retention Al2O3势垒工程提升HfO2基硅沟道FeFET保持特性

Z. Chen, T. Hu, X. Jia, et al.

IEEE Transactions on Electron Devices · 2026-07-01

Chen et al. insert Al2O3 layers as both tunneling dielectric and gate interlayer in an HfZrO2 FeFET stack. With a 2 nm tunneling layer and 3 nm gate interlayer, the devices show a 9 V memory window and projected 0.44% memory-window loss over 10 years at -13 V to +14 V operation. The retention result is strong for FeFET scaling discussions, but the operating voltage and stack complexity remain important manufacturability questions. Chen等人在HfZrO2 FeFET栈中引入Al2O3,同时作为隧穿介质层和栅介质插层。在2 nm隧穿层与3 nm栅插层条件下,器件显示9 V存储窗口,并在-13 V至+14 V工作下预测10年存储窗口损失仅0.44%。这一保持特性对FeFET缩放很有参考价值,但工作电压和堆栈复杂度仍是制造可行性的关键问题。

GaN-on-Diamond HEMTs Reach 25 W/mm at X-Band 金刚石衬底GaN HEMT在X波段达到25 W/mm

X. Zhou, G. Zhou, Y. Lv, et al.

IEEE Transactions on Electron Devices · 2026-07-01

Zhou et al. fabricate AlGaN/GaN HEMTs on polycrystalline diamond using room-temperature wafer bonding and a roughly 17 nm bonding interface. Load-pull measurements on 4 x 100 micron devices report 25.28 W/mm at 10 GHz with 33.43% power-added efficiency, while channel temperature falls by about 150 C versus GaN-on-SiC at 31.5 W/mm DC power density. The paper attacks the RF power thermal wall directly; the next question is whether the bonding interface can scale with yield and cost. Zhou等人通过室温晶圆键合和约17 nm键合界面,在多晶金刚石衬底上制备AlGaN/GaN HEMT。4 x 100微米器件的负载牵引测试在10 GHz下达到25.28 W/mm,功率附加效率为33.43%,并且在31.5 W/mm直流功率密度下相比GaN-on-SiC沟道温度降低约150 C。论文直接针对RF功率器件的热墙;下一步问题是该键合界面能否以可接受良率和成本放大。

AI Accelerators & Compute-in-Memory AI加速器与存算一体

Probabilistic Memory for Edge-AI Sampling at Native Memory Bandwidth 面向边缘AI的原生带宽概率存储

L. Pei, J. Zheng, X. Zhao, et al.

arXiv:2607.02465 · 2026-07-02T17:31:17Z

Pei et al. propose p-MEM, a memory primitive that stores distribution parameters and samples directly at memory bandwidth instead of generating Gaussian random numbers as a separate compute step. The layout-validated simulator reports more than 1000 GSa/s/mm2 GRNG throughput, plus CPU/GPU reductions of up to 2.19x/4.37x in instruction count, 562x/3.45x in sampling latency, and 295.5x/3.53x in energy for Bayesian neural-network workloads. This is a hardware-relevant answer to probabilistic AI overhead, but it remains a simulated architecture rather than measured silicon. Pei等人提出p-MEM,一种存储分布参数并直接以存储带宽采样的存储原语,而不是把高斯随机数生成作为独立计算步骤。经过版图验证的模拟器显示,GRNG吞吐超过1000 GSa/s/mm2,并在贝叶斯神经网络负载中让CPU/GPU指令数最多降低2.19x/4.37x,采样延迟降低562x/3.45x,能耗降低295.5x/3.53x。这是对概率AI开销的硬件化回应,但目前仍是模拟架构而非实测硅片。

A 28-nm System-in-One-Macro eDRAM Compute-in-Memory Chip 28 nm系统级单宏eDRAM存内计算芯片

Z. Qian, Z. Cong, S. Yan, et al.

IEEE Journal of Solid-State Circuits · 2026-07-01

Qian et al. present a 28 nm compute-in-memory chip that pulls system-level components, except control logic, into a single macro. The design uses leakage-eliminated 2T1C and capacitor-over-logic 1T1C eDRAM to reduce the SRAM access, long interconnect, and accumulation overheads that often erase macro-level CIM gains. The paper is valuable because it treats CIM as a system layout problem, not only as a bitcell energy-efficiency claim. Qian等人展示了一颗28 nm存内计算芯片,把除控制逻辑外的系统级组件整合进单个宏单元。该设计采用消除漏电的2T1C和电容置于逻辑之上的1T1C eDRAM,以减少SRAM访问、长互连和累加单元开销,这些开销常常抵消宏单元层面的CIM收益。论文的价值在于把CIM视为系统版图问题,而不只是位单元能效声明。

A Booth-Based Digital SRAM CIM Macro With 16.8 TOPS/W at 8b/8b 8b/8b下达到16.8 TOPS/W的Booth数字SRAM CIM宏

Y. Jiang, X. Wang, H. You, et al.

IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2026-07-01

Jiang et al. build a Booth-based all-digital SRAM CIM macro for flexible multiply-accumulate operations across bit widths. The 55 nm CMOS measurement reports 16.8 TOPS/W for 8b/8b MACs, using pre-encoding, two-transistor bit retention and shifting, and multiphase accumulation to reduce overhead. It is a practical digital-CIM entry because the result keeps standard CMOS and integer precision in view, though array-scale integration details still determine system usefulness. Jiang等人构建了一个基于Booth编码的全数字SRAM CIM宏,用于支持不同位宽的乘加运算。55 nm CMOS实测在8b/8b MAC下达到16.8 TOPS/W,并通过预编码、两晶体管位保持与移位、多相累加来降低开销。这是一个更偏实用的数字CIM结果,因为它保留了标准CMOS和整数精度视角,但系统价值仍取决于阵列级集成细节。

BRAM-Free Approximate Softmax for FPGA Vision Transformer Inference 面向FPGA视觉Transformer推理的无BRAM近似Softmax

M. Usman, S. Khan, D. Merhof

arXiv:2607.01798 · 2026-07-02T07:15:08Z

Usman et al. replace the costly softmax exponential in FPGA Vision Transformer inference with a 16-segment piecewise-linear natural-exponential approximation implemented in distributed LUT fabric. On a Xilinx Zynq-7020 attention-row core, the design uses 1444 LUTs, 77 DSPs, and no BRAM, avoiding table-heavy or CORDIC-style implementations. The hardware angle is clear for small FPGAs, but the reported result is still core-level and depends on model-level accuracy under approximation. Usman等人用16段分段线性自然指数近似替代FPGA视觉Transformer推理中昂贵的softmax指数计算,并完全用分布式LUT织构实现。在Xilinx Zynq-7020的attention-row核心上,该设计使用1444个LUT、77个DSP且不占用BRAM,避免了查表密集或CORDIC式实现。其硬件价值对小型FPGA很明确,但结果仍处于核心级,最终取决于近似下的模型级精度。

Circuits & Architectures 电路与架构

A 2T-Pixel CMOS Imager for In-Pixel Multi-Bit Feature Extraction 用于像素内多比特特征提取的2T像素CMOS图像传感器

A. Abubakar, B. Wang, A. Bermak

IEEE Transactions on Circuits and Systems Part 1: Regular Papers · 2026-07-01

Abubakar et al. demonstrate a computational CMOS image sensor that performs signed analog-domain multi-bit convolution directly inside the pixel array. The 0.18-micron prototype keeps a 43% fill factor, supports up to eight programmable convolution kernels per frame, and reports 1.5-2.0 TOPS/W normalized to 1-bit at 14-112 fps and 61.8-82.4 microwatts total chip power. This is useful edge-vision silicon because it removes intermediate SRAM and DAC storage, though the normalized precision metric should be read carefully. Abubakar等人展示了一种计算型CMOS图像传感器,可在像素阵列内直接执行带符号模拟域多比特卷积。0.18微米原型保持43%填充因子,每帧支持最多8个可编程卷积核,并在14-112 fps、整芯片61.8-82.4微瓦功耗下给出按1-bit归一化的1.5-2.0 TOPS/W。该硅片对边缘视觉有价值,因为它去除了中间SRAM和DAC存储,但归一化精度指标需要谨慎解读。

EDA & Hardware Security EDA与硬件安全

LIB-TRAP Tests Hardware-Trojan Risk in Standard Cell Libraries LIB-TRAP评估标准单元库中的硬件木马风险

H. K. Dharavath, M. M. A. Chowdhury, R. Yasaei, et al.

arXiv:2607.01526 · 2026-07-01T22:46:48Z

Dharavath et al. move the hardware-Trojan threat model into the standard cell library itself, treating the library as untrusted rather than assuming malicious insertion only around placed cells. Using EDA flows with Saed32nm and Sky130nm libraries, they show how malicious cells can mask arbitrary Trojans from designers until a foundry-side replacement activates them. The result is important for fabless security reviews because it pushes trust boundaries down to library provenance and signoff, though the strongest attacks assume a coordinated adversarial supply chain. Dharavath等人把硬件木马威胁模型推进到标准单元库本身,将库视为不可信,而不是只假设木马被插入到已布局单元周围。他们使用Saed32nm和Sky130nm库的EDA流程,展示恶意单元如何在设计者面前隐藏任意木马,直到晶圆厂侧替换激活。该结果对无晶圆厂安全审查很重要,因为它把信任边界下推到库来源和签核流程;但最强攻击仍假设存在协同的恶意供应链。