In-DRAM Signatures from Simultaneous Multi-Row Activation 利用同时多行激活生成DRAM内签名
arXiv:2606.15470 · 2026-06-13T20:57:07Z
The paper demonstrates a DRAM PUF based on simultaneous multiple-row activation using 112 off-the-shelf DDR4 chips. The reported intra-Jaccard indices reach roughly 89% to 95% while inter-device indices stay near 2% to 4%, indicating repeatability within a chip and uniqueness across chips. The result is useful because it turns a memory disturbance mechanism into an authentication primitive, though deployment would still need controller support and temperature-aware calibration. 论文基于112颗商用DDR4芯片,展示了利用同时多行激活实现DRAM PUF的方法。文中报告的片内Jaccard指数约为89%到95%,片间指数约为2%到4%,说明同一芯片内可重复、不同芯片间可区分。该结果的意义在于把一种存储扰动机制转化为认证原语,但实际部署仍需要内存控制器支持和温度校准。